Image Segmentation of Non-Destructive Test Based on Image Patch and Cluster Information Quantity

Zhanlong Zhu; Yongjun Liu; Yamei Li; Junfen Wang; Boyuan Deng

doi:10.3788/LOP202158.1210009

Journals >Laser & Optoelectronics Progress >Volume 58 >Issue 12 >Page 1210009 > Article

Laser & Optoelectronics Progress
Vol. 58, Issue 12, 1210009 (2021)

Image Segmentation of Non-Destructive Test Based on Image Patch and Cluster Information Quantity

Zhanlong Zhu^1、2、3, Yongjun Liu¹, Yamei Li^1、2, Junfen Wang^1、2、*, and Boyuan Deng¹

Author Affiliations

¹School of Information Engineering, Heibei GEO University, Shijiazhuang, Hebei 0 50031, China

²Hebei Key Laboratory of Optoelectronic Information and Geo-Detection Technology, Shijiazhuang, Hebei 0 50031, China

³Intelligent Sensor Network Engineering Research Center of Hebei Province, Shijiazhuang, Hebei 0 50031, China

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DOI: 10.3788/LOP202158.1210009 Cite this Article Set citation alerts

Zhanlong Zhu, Yongjun Liu, Yamei Li, Junfen Wang, Boyuan Deng. Image Segmentation of Non-Destructive Test Based on Image Patch and Cluster Information Quantity[J]. Laser & Optoelectronics Progress, 2021, 58(12): 1210009 Copy Citation Text

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