[1] Radasky W A, Baum C E, Wik M W. Introduction to the special issue on high-power electromagnetics (HEMP) and intentional electromagnetic interference (IEMI)［J］. IEEE Trans Elec-Mag Compact, 2004, 46(3): 314-321.
[3] Backstrom M G, Lovstrand K G. Susceptibility of electronic systems to high-power microwaves: summary of test experience［J］. IEEE Trans Elec-Mag Compact, 2004, 46(3): 396-403.
[7] IEC 61000-4-3, Electromagnetic compatibility (EMC)-Part 4-3: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test［S］.
