• Acta Optica Sinica
  • Vol. 41, Issue 5, 0516003 (2021)
Junwei Li1, Chengying Shi1, Zujun Wang2、*, and Yuanyuan Xue2
Author Affiliations
  • 1Xi′an Research Institute of High-Technology, Xi′an, Shaanxi 710025, China
  • 2Northwest Institute of Nuclear Technology, Xi′an, Shaanxi 710024, China
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    DOI: 10.3788/AOS202141.0516003 Cite this Article Set citation alerts
    Junwei Li, Chengying Shi, Zujun Wang, Yuanyuan Xue. Theoretical Simulation on Degradation of GaAs Sub-Cells Induced by Proton Irradiation with Different Energies[J]. Acta Optica Sinica, 2021, 41(5): 0516003 Copy Citation Text show less
    Structure model of GaAs sub-cell
    Fig. 1. Structure model of GaAs sub-cell
    Degradation results of normalized maximum power of GaAs sub-cell irradiated by 5 MeV and 10 MeV protons versus proton fluence
    Fig. 2. Degradation results of normalized maximum power of GaAs sub-cell irradiated by 5 MeV and 10 MeV protons versus proton fluence
    Degradation results of normalized short-circuit current density of GaAs sub-cell versus proton fluence for different irradiation energies
    Fig. 3. Degradation results of normalized short-circuit current density of GaAs sub-cell versus proton fluence for different irradiation energies
    Schematic of photon absorption in active region of GaAs sub-cell
    Fig. 4. Schematic of photon absorption in active region of GaAs sub-cell
    Degradation results of normalized open voltage of GaAs sub-cell versus proton fluence for different irradiation energies
    Fig. 5. Degradation results of normalized open voltage of GaAs sub-cell versus proton fluence for different irradiation energies
    Degradation results of normalized fill factor of GaAs sub-cell versus proton fluence for different irradiation energies
    Fig. 6. Degradation results of normalized fill factor of GaAs sub-cell versus proton fluence for different irradiation energies
    Degradation results of normalized maximum power of GaAs sub-cell versus proton fluence for different irradiation energies
    Fig. 7. Degradation results of normalized maximum power of GaAs sub-cell versus proton fluence for different irradiation energies
    Degradation result of normalized maximum power of GaAs sub-cell versus displacement damage dose
    Fig. 8. Degradation result of normalized maximum power of GaAs sub-cell versus displacement damage dose
    External quantum efficiencies of GaAs sub-cell for different proton irradiation energies when proton fluence is 1×1013 cm-2
    Fig. 9. External quantum efficiencies of GaAs sub-cell for different proton irradiation energies when proton fluence is 1×1013 cm-2
    Material parameterValue
    Dielectric constant10.9
    Band gap /eV1.42
    Electron affinity /eV4.07
    Electron mobility /(cm2·V-1·s-1)8500
    Hole mobility /(cm2·V-1·s-1)400
    Intrinsic carrier concentration /cm-32×106
    Table 1. Related physical parameters of GaAs in simulation
    Deep levelEnergy /eVDefect introduction rate /cm-1
    H1Ev+0.181.30
    H2Ev+0.231.31
    H3Ev+0.271.24
    H4Ev+0.771.01
    E1Ec-0.141.10
    E2Ec-0.251.14
    E3Ec-0.541.06
    E4Ec-0.720.98
    Table 2. Deep-level defects of proton irradiated GaAs sub-cell obtained by DLTS measurement[13]
    Junwei Li, Chengying Shi, Zujun Wang, Yuanyuan Xue. Theoretical Simulation on Degradation of GaAs Sub-Cells Induced by Proton Irradiation with Different Energies[J]. Acta Optica Sinica, 2021, 41(5): 0516003
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