[1] Yu Fei, Ren Xifeng, Li Sujun. Analysis of noise for infrared focal plane array in low temperature background [J]. Infrared and Laser Engineering, 2017, 46(3): 0304003． (in Chinese)

[2] Gao Y Q, Huang Z M, Hou Y, et al. Structural and electrical properties of Mn1.56Co0.96Ni0.48O4 NTC thermistor films [J]. Materials Science and Engineering: B, 2016, 185(7): 74-78.

[3] Karanth S, Sumesh M A, Shobha V, et al. Infrared detectors based on thin film thermistor of ternary Mn-Co-Ni-O on micro-machined thermal isolation structure [J]. Sensors and Actuators A: Physical, 2009(153): 69-75.

[4] Huang Meng. A low frequency noise test system for thermistor infrared detectors [J]. Computer Measurement & Control, 2016(2): 318-320. (in Chinese)

[5] Ma Ning, Liu Sha, Li Jiangyong. Analysis on spatial noise and temporal noise of IR thermal imager [J]. Laser & Infrared, 2017, 47(6): 717-721. (in Chinese)

[6] Gino Giusi, Felice Crupi, Calogero Pace. A procedure for extracting 1/f noise from random telegraph signals[J]. Transactions on Electron Device, IEEE, 1989, 36(12): 1773-1782.

[8] Zhuang Yiqi, Sun Qing. Noise as tool to characterize electron device reliability [J]. Acta Eelectronica Sinica, 1996, 24(2): 82-87. (in Chinese)

[9] Wu Yong, Ma Zhongfa, Du Lei. Thin-film resistor reliability characterization based on low frequency noise [J]. Electronic Science and Technology, 2014(12): 100-104, 107. (in Chinese)

[10] Chen Kunfeng, Wang Yongzhong, Ying Chengping. Research of the ultra-low-noise test system[J]. Journal of Jiamusi University(Natural Science Edition), 2017, 35(5): 825-827. (in Chinese)

[11] Dai Yisong, Ding Hong, Zhang Xinfa. The measurement and analysis system of low frequency noise spectrum in the temperature range of 77-300 K [J]. Chinese Journal of Scientific Instrument, 1995, 16(3): 231-236. (in Chinese)