Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Acta Optica Sinica >Volume 42 >Issue 9 >Page 0906002 > Article
    • Acta Optica Sinica
    • Vol. 42, Issue 9, 0906002 (2022)
    Phase Demodulation Method for Non-Periodic Signal in Extrinsic Fabry-Perot Interferometric Sensor
    Shuhuan Zhang1,2 and Yi Jiang1,2,*
    Author Affiliations
  • 1School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China
  • 2Key Laboratory of Photonic Information Technology, Ministry of Industry and Information Technology, Beijing 100081, China
    • show less
    DOI: 10.3788/AOS202242.0906002 Cite this Article Set citation alerts
    Shuhuan Zhang, Yi Jiang. Phase Demodulation Method for Non-Periodic Signal in Extrinsic Fabry-Perot Interferometric Sensor[J]. Acta Optica Sinica, 2022, 42(9): 0906002 Copy Citation Text show less
    Cited By
    Article index updated: Jun. 4, 2025
    The article is cited by 2 article(s) CLP online library. (Some content might be in Chinese.)
    Abstract
    Get PDF(in Chinese)
    Figures&Tables (8)
    Equations (0)
    References (19)
    Cited By (2)
    Get Citation
    Copy Citation Text
    Shuhuan Zhang, Yi Jiang. Phase Demodulation Method for Non-Periodic Signal in Extrinsic Fabry-Perot Interferometric Sensor[J]. Acta Optica Sinica, 2022, 42(9): 0906002
    Download Citation
    Set citation alerts for the article
    Tools
    Share
    Set citation alerts for the article
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology