• Chinese Optics Letters
  • Vol. 1, Issue 12, 12716 (2003)
Sipeng Gu1、2、*, Lisong Hou1, Qitao Zhao1, and Rui’an Huang1
Author Affiliations
  • 1Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800
  • 2Department of Physics, New Jersey Institute of Technology, Newark, NJ 07102, USA
  • show less
    DOI: Cite this Article Set citation alerts
    Sipeng Gu, Lisong Hou, Qitao Zhao, Rui’an Huang. Thermal phase change and activation energy of crystallization of Ge-Sb-Te-Sn thin films[J]. Chinese Optics Letters, 2003, 1(12): 12716 Copy Citation Text show less
    References

    [1] T. H. Jeong, M. R. Kim, and H. Seo, J. Appl. Phys. 8979, 774 (1999).

    [2] M. R. Kim, H. Seo, and T. H. Jung, Proc. SPIE 3401, 259 (1998).

    [3] C.-M. Lee, T.-S. Chin, and Y.-Y. Huang, Jpn. J. Appl. Phys 39, 6369 (2000).

    [4] F. X. Gan, L. S. Hou, and G. B. Wang, Mat. Sci. and Eng. B 76, 63 (2000).

    [5] F. S. Jiang and M. Okuda, Jpn. J. Appl. Phys. 30, 97 (1991).

    [6] H. F. Hu, F. Y. Lin, and Y. B. Yuan, J. Non-Cryst. Solids 112, 306 (1989).

    [7] H. Yinnon and D. R. Uhlmann, J. Non-Cryst. Solids 54, 253 (1983).

    CLP Journals

    [1] [in Chinese], [in Chinese], [in Chinese]. Structure and Optical Property Changes of Heat Induced NiOxThin Films[J]. Chinese Journal of Lasers, 2007, 34(1): 125

    Sipeng Gu, Lisong Hou, Qitao Zhao, Rui’an Huang. Thermal phase change and activation energy of crystallization of Ge-Sb-Te-Sn thin films[J]. Chinese Optics Letters, 2003, 1(12): 12716
    Download Citation