• Chinese Optics Letters
  • Vol. 7, Issue 8, 08738 (2009)
Min Dai1、2, Zhong Zhang1, Jingtao Zhu1, Xiaoqiang Wang1, Jing Xu1, Xiuhua Fu2, Liang Bai1, Qiushi Huang1, Zhanshan Wang1, and Lingyan Chen1
Author Affiliations
  • 1Institute of Precision Optical Engineering, Department of Physics, Tongji University, Shanghai 200092, China
  • 2Department of Physics, Changchun University of Science and Technology, Changchun 130022, China
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    DOI: 10.3788/COL20090708.0738 Cite this Article Set citation alerts
    Min Dai, Zhong Zhang, Jingtao Zhu, Xiaoqiang Wang, Jing Xu, Xiuhua Fu, Liang Bai, Qiushi Huang, Zhanshan Wang, Lingyan Chen. Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable bi-layer number by X-ray reflection and diffuse scattering[J]. Chinese Optics Letters, 2009, 7(8): 08738 Copy Citation Text show less
    References

    [1] A. F. Jankowski, L. R. Schrawyer, and M. A. Wall, J. Appl. Phys. 68, 5162 (1990).

    [2] J. F. Seely, G. Gutman, J. Wood, G. S. Herman, M. P. Kowalski, J. C. Rife, and W. R. Hunter, Appl. Opt. 32, 3541 (1993).

    [3] D. L. Windt, E. M. Gullikson, and C. C. Walton, Opt. Lett. 27, 2212 (2002).

    [4] F. Wang, Z. Wang, Z. Zhang, W. Wu, H. Wang, S. Zhang, S. Qin, and L. Chen, Opt. Precision Eng. (in Chinese) 13, 28 (2005).

    [5] B. Ma, Z. Wang, H. Wang, F. Wang, W. Wu, Z. Zhang, S. Qin, and L. Chen, Act. Opt. Sin. (in Chinese) 25, 1581 (2005).

    [6] Z. Zhang, Z. Wang, W. Wu, H. Wang, F. Wang, C. Gu, S. Qin, L. Chen, W. Hua, and Y. Huang, Nucl. Technol. (in Chinese) 28, 900 (2005).

    [7] Z. Zhang, Z. Wang, J. Zhu, F. Wang, Y. Wu, S. Qin, and L. Chen, Chin. Phys. Lett. 23, 2678 (2005).

    [8] Z. Zhang, Z. Wang, J. Zhu, Y. Wu, B. Mu, F. Wang, S. Qin, and L. Chen, Chin. Phys. Lett. 24, 3365 (2007).

    [9] N. K. Pleshanov, Nucl. Instrum. Methods Phys. Res. A 524, 273 (2004).

    [10] N. K. Pleshanov, N. G. Kolyvanova, S. V. Metelev, B. G. Peskov, V. M. Pusenkov, V. G. Syromyatnikov, V. A. Ul’yanov, and A. F. Schebetov, Phys. B 369, 234 (2005).

    [11] J. Qin, J. Shao, K. Yi, and Z. Fan, Chin. Opt. Lett. 5, 301 (2006).

    [12] E. Spiller, D. Stearns, and M. Krumrey, J. Appl. Phys. 74, 107 (1993).

    [13] S. Zhang, J. Zhu, F. Wang, Z. Zhang, Z. Shen, Z. Wang, H. Zhou, and T. Huo, Opt. Instrum. (in Chinese) 28, 137 (2006).

    CLP Journals

    [1] Moyan Tan, Haochuan Li, Qiushi Huang, Hongjun Zhou, Tonglin Huo, Xiaoqiang Wang, Jingtao Zhu. Mo/Si aperiodic multilayer broadband reflective mirror for 12.5–28.5-nm wavelength range[J]. Chinese Optics Letters, 2011, 9(2): 023102

    Data from CrossRef

    [1] Haixia Wang, Dechao Xu, Jie Zhu, Zhong Zhang, Radhwan Alnaimi, Baozhong Mu, Zhanshan Wang, Hong Chen. Investigation in the interface roughness of DC-sputtered Mo/B4C multilayer mirrors with variable layer pairs for 7-nm soft X-ray polarizers. Optik, 125, 3415(2014).

    Min Dai, Zhong Zhang, Jingtao Zhu, Xiaoqiang Wang, Jing Xu, Xiuhua Fu, Liang Bai, Qiushi Huang, Zhanshan Wang, Lingyan Chen. Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable bi-layer number by X-ray reflection and diffuse scattering[J]. Chinese Optics Letters, 2009, 7(8): 08738
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