Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable bi-layer number by X-ray reflection and diffuse scattering

Min Dai; Zhong Zhang; Jingtao Zhu; Xiaoqiang Wang; Jing Xu; Xiuhua Fu; Liang Bai; Qiushi Huang; Zhanshan Wang; Lingyan Chen

doi:10.3788/COL20090708.0738

Journals >Chinese Optics Letters >Volume 7 >Issue 8 >Page 08738 > Article

Chinese Optics Letters
Vol. 7, Issue 8, 08738 (2009)

Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable bi-layer number by X-ray reflection and diffuse scattering

Min Dai^1、2, Zhong Zhang¹, Jingtao Zhu¹, Xiaoqiang Wang¹, Jing Xu¹, Xiuhua Fu², Liang Bai¹, Qiushi Huang¹, Zhanshan Wang¹, and Lingyan Chen¹

Author Affiliations

¹Institute of Precision Optical Engineering, Department of Physics, Tongji University, Shanghai 200092, China

²Department of Physics, Changchun University of Science and Technology, Changchun 130022, China

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DOI: 10.3788/COL20090708.0738 Cite this Article Set citation alerts

Min Dai, Zhong Zhang, Jingtao Zhu, Xiaoqiang Wang, Jing Xu, Xiuhua Fu, Liang Bai, Qiushi Huang, Zhanshan Wang, Lingyan Chen. Influence of interface roughness on reflectivity of tungsten/boron-carbide multilayers with variable bi-layer number by X-ray reflection and diffuse scattering[J]. Chinese Optics Letters, 2009, 7(8): 08738 Copy Citation Text

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