• Opto-Electronic Engineering
  • Vol. 30, Issue 4, 46 (2003)
[in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Study on DIC microscopy and its application in observation of atmospheric particles[J]. Opto-Electronic Engineering, 2003, 30(4): 46 Copy Citation Text show less
    References

    [1] CAPPRETTE D R. Differential Interference Contrast(Nomarski. DIC, Hoffman Modulation Contrast )[EB/OL]. http:// www. ruf. rice. edu/bioslabs/ methods/microscopy/dic/html , 2002-01-18 .

    [2] BRANDMAIER Chris, SPRING K R, KAVIDSON M W. Reflected Light DIC Microscopy[EB/OL]. http:// www. microscopyu. com/ articles/reflecteddic. html, 2002-09-10.

    [3] BRANDMAIER Chris, SPRING K R, SUTTER R T. Wavefront Relationships in Reflected Light DIC Microscopy[EB/OL]. http:// www. microscopyu. com/ tutorials/java/dic/ reflected wavefronts/index .html, 2002-09-10.

    [4] BRENNER Merrill. Infinity optics can make a difference [J]. Research & Development, Highlands Ranch, 1997, 39(9): 47.1.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Study on DIC microscopy and its application in observation of atmospheric particles[J]. Opto-Electronic Engineering, 2003, 30(4): 46
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