• Opto-Electronic Engineering
  • Vol. 30, Issue 6, 32 (2003)
[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
Author Affiliations
  • [in Chinese]
  • show less
    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. An infrared temperature-measuring system for a small high-temperature region on semiconductor substrate[J]. Opto-Electronic Engineering, 2003, 30(6): 32 Copy Citation Text show less

    Abstract

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. An infrared temperature-measuring system for a small high-temperature region on semiconductor substrate[J]. Opto-Electronic Engineering, 2003, 30(6): 32
    Download Citation