• Infrared and Laser Engineering
  • Vol. 37, Issue 2, 208 (2008)
[in Chinese]*, [in Chinese], and [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese]. Nano-width interference fringes of laser feedback[J]. Infrared and Laser Engineering, 2008, 37(2): 208 Copy Citation Text show less
    References

    [1] SHIMIZU E T.Directional discrimination in the self-mixing type laser Doppler velocimeter[J].Appl Opt,1987,26:4541-4544.

    [2] SUZUKI T,MUTO T,SASAKI O,et al.Self-mixing type of phase-locked laser diode interferometer[J].Appl Opt,1999,38:543-548.

    [3] TAKAHASHI N.Active heterodyne interferometric displacement measurement using optical feedback effects of laser diode[J].Opt Eng,1996,35:802-806.

    [4] KATO J,YAMATO J.Non-contact optical probing sensor appling optical feedback effects in laser diodes[J].Meas Sei Teeh,1991,3:146-153.

    [5] SEO D S,PARK J D,MCINERNEY J G,et al.Multiple feedback effects in asymmetric external cavity semiconductor semiconductor lasers[J].IEEE J Q E,1989,25:2229-2238.

    [6] LIU G,ZHANG S,ZHU J,et al.Signal frequency doubling of optical feedback by a birefringence external cavity with a quartz crystal plate[J].Appl Opt,2003,42:6636-6639.

    [7] FEI Li-gang,ZHANG Shu-lian.The discoverry of nanometer fringes in laser self-mixing interference[J].Optical Communications,2007,273:226-230.

    [8] FEI Li-gang,ZHANG Shu-lian.Polarization flipping in quasiisotropic laser with optical birefringence feedback[J].Optical Express,2004,12(25):6100-6105.

    CLP Journals

    [1] Fu Yangying, Xiao Guangzong, Zhang Bin. Study of Optical Feedback and Its Application Progress[J]. Laser & Optoelectronics Progress, 2015, 52(6): 60001

    [2] Wu Peng, Qin Shuijie. Study of solid-state microchip laser feedback technology in remote vibration measurement[J]. Infrared and Laser Engineering, 2018, 47(2): 206005

    [in Chinese], [in Chinese], [in Chinese]. Nano-width interference fringes of laser feedback[J]. Infrared and Laser Engineering, 2008, 37(2): 208
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