Fig. 1. XRD patterns for the Co₄₀Fe₄₀B₂₀ film samples and a pure GaAs(001) substrate.

Fig. 2. The M–H loops measured along [110] (a) and [11¯0] (b) crystallographic orientations of the GaAs(001) substrate and the azimuthal dependence of remanence ratio (c) for samples S1 and S2.

Fig. 3. (a) The measurement configuration of VNA-FMR. (b) Typical VNA-FMR spectra for several selected frequencies at φ_H = 0°. (c) Typical VNA-FMR spectra at various azimuthal angles recorded at f = 10 GHz. (d) The experimental (square dots) and fitted (red line) in-plane azimuthal dependence of H_r at f = 10 GHz.

Fig. 4. (a) The H_r dependences of frequency at φ_H = 0°, 30°, 60°, 75°, 90°, (b) azimuthal dependence of ΔH at f = 10 GHz, (c) frequency dependences of ΔH at φ_H = 0°, 30°, 60°, 75°, 90°, and (d) azimuthal dependence of α_eff for sample S1. The experimental results are shown as dots and the fitted results are shown as lines except for (b), in which the line is only guide to eyes.

Table 1. Magnetic damping constants at various azimuthal angles and the corresponding values of η in the CoFeB films with different compositions and thicknesses. The data for the Co₅₆Fe₂₄B₂₀ (10 nm) and Co₅₆Fe₂₄B₂₀ (20 nm) films are taken from Ref. [24].