Study on the measurement of large-aperture aspheric surfaces with annular sub-aperture scanning method

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 31 >Issue 9 >Page 26 > Article

Opto-Electronic Engineering
Vol. 31, Issue 9, 26 (2004)

Study on the measurement of large-aperture aspheric surfaces with annular sub-aperture scanning method

[in Chinese]^1、2, [in Chinese]¹, [in Chinese]¹, and [in Chinese]¹

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¹[in Chinese]

²[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Study on the measurement of large-aperture aspheric surfaces with annular sub-aperture scanning method[J]. Opto-Electronic Engineering, 2004, 31(9): 26 Copy Citation Text

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References

[3] KIM C J.Polynomial fit of interferograms[J].Appl.Opt,1982,21(24):4521-4525.

[4] Ying-Moh Liu,George N Lawrence,Christ L Kolipoulos.Subaperture testing of aspheres with annular zones[J].Appl.Opt,1988,27(21):4504-4513.

[5] Mauro Melozzi,Luca Pezzati,Alessandro Mazzoni.Testing aspheric surfaces using mulitiple annular interferograms[J].Opt.Eng,1993,32(5):1073-1079.

[9] Mahajan V N.Zernike annular polynomials for imaging systems with annular pupils[J].J.Opt.Soc.Am,1981,71(1):75-85.

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