• Opto-Electronic Engineering
  • Vol. 34, Issue 3, 140 (2007)
[in Chinese], [in Chinese], and [in Chinese]
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. Method of measuring roundness error based on slit diffraction[J]. Opto-Electronic Engineering, 2007, 34(3): 140 Copy Citation Text show less
    References

    [1] Wei Gao,Satoshi Kiyono,Tadatoshi Nomura.A new multiprobe method of roundness measurement[J].Precision Engineering,1996,19(1):37-45.

    [2] Klocke F,Friedrich D,Linke B,et al.Basics for in-process roundness error improvement by a functional workrest blade[J].CIRP Annals-Manufacturing Technology,2004,53(1):275-280.

    [3] Muralikrishnan B,Venkatachalam S,Raja J,et al.A note on the three-point method for roundness measurement[J].Precision Engineering,2005,29(2):257-260.

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    [in Chinese], [in Chinese], [in Chinese]. Method of measuring roundness error based on slit diffraction[J]. Opto-Electronic Engineering, 2007, 34(3): 140
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