A Fast Subpixel Edge Measurement Method Based on Sobel-Zernike Moment Operator

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 30 >Issue 5 >Page 59 > Article

Opto-Electronic Engineering
Vol. 30, Issue 5, 59 (2003)

A Fast Subpixel Edge Measurement Method Based on Sobel-Zernike Moment Operator

[in Chinese]¹, [in Chinese]¹, [in Chinese]², [in Chinese]¹, and [in Chinese]¹

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¹[in Chinese]

²[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A Fast Subpixel Edge Measurement Method Based on Sobel-Zernike Moment Operator[J]. Opto-Electronic Engineering, 2003, 30(5): 59 Copy Citation Text

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Abstract

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A Fast Subpixel Edge Measurement Method Based on Sobel-Zernike Moment Operator[J]. Opto-Electronic Engineering, 2003, 30(5): 59

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