[4] Xiao Li Dai, Osamil Sasaki, John Egreivenkamp et al.. High accuracy, wide range, rotation angle measurement by the use of two parallel interference patterns[J]. Appl. Opt., 1997, 36(25): 6190~6195
[4] Xiao Li Dai, Osamil Sasaki, John Egreivenkamp et al.. High accuracy, wide range, rotation angle measurement by the use of two parallel interference patterns[J]. Appl. Opt., 1997, 36(25): 6190~6195
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