Electronic speckle-pattern interferometry with polarization phase-shifting technique and it&#39;s application to deformation measurements

[in Chinese]; [in Chinese]

Journals >Acta Optica Sinica >Volume 10 >Issue 2 >Page 161 > Article

Acta Optica Sinica
Vol. 10, Issue 2, 161 (1990)

Electronic speckle-pattern interferometry with polarization phase-shifting technique and it's application to deformation measurements

[in Chinese]¹ and [in Chinese]²

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¹[in Chinese]

²[in Chinese]

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[in Chinese], [in Chinese]. Electronic speckle-pattern interferometry with polarization phase-shifting technique and it's application to deformation measurements[J]. Acta Optica Sinica, 1990, 10(2): 161 Copy Citation Text

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