• Optics and Precision Engineering
  • Vol. 32, Issue 1, 1 (2024)
Xiuhua FU1,2, Yujun WEI1,2,*, Zhaowen LIN2,3, Yonggang PAN2,3..., Gang LI4 and Guangyuan FU1,2|Show fewer author(s)
Author Affiliations
  • 1College of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun30022, China
  • 2Zhongshan Research Institute, Changchun University of Science and Technology, Zhongshan58436,China
  • 3Zhongshan Jilian Optoelectronic Technology Co., Ltd., Zhongshan52846, China
  • 4Yunnan North Optical Technology Co. Ltd., Kunming650216, China
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    DOI: 10.37188/OPE.20243201.0001 Cite this Article
    Xiuhua FU, Yujun WEI, Zhaowen LIN, Yonggang PAN, Gang LI, Guangyuan FU. Thin-layer control error analysis and performance optimization of visible light anti-reflection film[J]. Optics and Precision Engineering, 2024, 32(1): 1 Copy Citation Text show less
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    Xiuhua FU, Yujun WEI, Zhaowen LIN, Yonggang PAN, Gang LI, Guangyuan FU. Thin-layer control error analysis and performance optimization of visible light anti-reflection film[J]. Optics and Precision Engineering, 2024, 32(1): 1
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