Optical Transmissivity Detection with Wide Spectrum for Optic Aiming Device and Analysis of Its Influencing Factors

Liu Ming; Zhang Guoyu; An Zhiyong; Wang Jinsong; Xia Yang

doi:10.3788/lop51.061201

[1] Wang Jinsong, An Zhiyong, Li Hailan. Research on the measuring method to the IR aiming sight′s sight line alteration of reflection type collimator[J]. Acta ArmamentarII, 2010, 31(11): 1422-1425.

[2] H Nasibov, I Mamedbeili, D Riza. High-precision measurements of reflectance, transmittance and scattering at 632.8 nm [C]. SPIE, 2012, 8433: 843313.

[3] He Lingping, Chen Bo, Yang Lin, et al.. In situ optic measuring technique based on virtual lock [J]. Optics and Precision Engineering, 2008, 16(9): 1677-1681.

[4] Li Chenxi, Zhao Huijuan, Wang Qiuyin, et al.. A near infrared multi- wavelength optical properties measurement system based on double-integrating-spheres and lock in detection[J]. Acta Photonica Sinica, 2009, 38(7): 1811-1815.

[5] Xu Han, Lu Qipeng, Piao Renguan. Research of near- infrared spectrum detecting circuit with LIA[J]. Microcomputer Information, 2009, 25(8-2): 233-235.

[6] Feng Qibo. Optical Measurement Techniques and Application[M]. Beijing: Tsinghua University Press, 2008. 162-165.

[7] J Cheung, J L Gardner, A Migdall, et al.. High accuracy dual lens transmittance measurements[J]. Appl Opt, 2007, 46(22): 5396-5397.

[8] J Campos, A Corrons, A Pons, et al.. Spectral responsivity uncertainty of silicon photodiodes due to calibration[J]. Meas Sci and Technol, 2001, 12(11): 1926-1931.

[9] Cheng Wansheng, Zhao Jie, Cai Hegao. Correction method for pixel response nonuniformity of CCD[J]. Optics and Precision Engineering, 2008, 16(2): 314-318.

[10] Ma Hong, Wang Jinbo. Theory of Instrument Aceuracy[M]. Beijing: Beihang University Press, 2009. 127-129.

[12] X Gong, M Tong, Y Xia, et al.. High detectivity polymer photodetectors with spectral response from 300 nm to 1450 nm [J]. Science, 2009, 325(5948): 1665-1667.