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    Journals >Acta Optica Sinica >Volume 15 >Issue 1 >Page 112 > Article
    • Acta Optica Sinica
    • Vol. 15, Issue 1, 112 (1995)
    An Atomic Force Microscope
    [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. An Atomic Force Microscope[J]. Acta Optica Sinica, 1995, 15(1): 112 Copy Citation Text show less
    References

    CLP Journals

    [1] Fu Xia, Xie Zhigang, Zhang Haijun, Zhang Dongxian. A Novel Electrochemical Atomic Force Microscope and its Applications[J]. Chinese Journal of Lasers, 2008, 35(s2): 147

    [2] Guo Li, Zhou Yage, Zhang Dongxian, Zhang Haijun. A Dual-probe Three-Dimensional Profile Measurement System[J]. Acta Optica Sinica, 2008, 28(s2): 249

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. An Atomic Force Microscope[J]. Acta Optica Sinica, 1995, 15(1): 112
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    Paper Information
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