Research on Nondestructive Testing of Corn Seed Vigor Based on THz-TDS Reflection Imaging

WU Jing-zhu; LI Xiao-qi; LIU Cui-ling; YU Le; SUN Xiao-rong; SUN Li-juan

doi:10.3964/j.issn.1000-0593(2020)09-2840-05

Journals >Spectroscopy and Spectral Analysis >Volume 40 >Issue 9 >Page 2840 > Article

Spectroscopy and Spectral Analysis
Vol. 40, Issue 9, 2840 (2020)

Research on Nondestructive Testing of Corn Seed Vigor Based on THz-TDS Reflection Imaging

WU Jing-zhu^1、*, LI Xiao-qi¹, LIU Cui-ling¹, YU Le¹, SUN Xiao-rong¹, and SUN Li-juan²

Author Affiliations

¹[in Chinese]

²[in Chinese]

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DOI: 10.3964/j.issn.1000-0593(2020)09-2840-05 Cite this Article

WU Jing-zhu, LI Xiao-qi, LIU Cui-ling, YU Le, SUN Xiao-rong, SUN Li-juan. Research on Nondestructive Testing of Corn Seed Vigor Based on THz-TDS Reflection Imaging[J]. Spectroscopy and Spectral Analysis, 2020, 40(9): 2840 Copy Citation Text

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References

[3] Julio Marcos-Filho. Scientia Agricola, 2015, 72(4): 363.

[4] Moreira J, Cardoso R R, Bragab R A. Opt. Laser Eng., 2014, 61: 8.

[7] Liu Wei, Liu Changhong, Hu Xiaohua, et al. Food Chemistry, 2016, 210: 415.

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