Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Laser & Optoelectronics Progress >Volume 57 >Issue 4 >Page 041515 > Article
    • Laser & Optoelectronics Progress
    • Vol. 57, Issue 4, 041515 (2020)
    Mug Defect Detection Method Based on Improved Faster RCNN
    Dongjie Li* and Ruohao Li
    Author Affiliations
  • School of Automation, Harbin University of Science and Technology, Harbin, Heilongjiang 150080, China
    • show less
    DOI: 10.3788/LOP57.041515 Cite this Article Set citation alerts
    Dongjie Li, Ruohao Li. Mug Defect Detection Method Based on Improved Faster RCNN[J]. Laser & Optoelectronics Progress, 2020, 57(4): 041515 Copy Citation Text show less
    Cited By
    Article index updated: May. 29, 2024
    Citation counts are provided from Researching.
    The article is cited by 7 article(s) from Researching.
    Abstract
    Get PDF(in Chinese)
    Figures&Tables (9)
    Equations (0)
    References (22)
    Cited By (7)
    Get Citation
    Copy Citation Text
    Dongjie Li, Ruohao Li. Mug Defect Detection Method Based on Improved Faster RCNN[J]. Laser & Optoelectronics Progress, 2020, 57(4): 041515
    Download Citation
    Set citation alerts for the article
    Tools
    Share
    Set citation alerts for the article
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology