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    Journals >Acta Optica Sinica >Volume 1 >Issue 3 >Page 265 > Article
    • Acta Optica Sinica
    • Vol. 1, Issue 3, 265 (1981)
    A method for measuring the waveguide film parameters by grating couplers
    XU DEWEI
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    XU DEWEI. A method for measuring the waveguide film parameters by grating couplers[J]. Acta Optica Sinica, 1981, 1(3): 265 Copy Citation Text show less
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    XU DEWEI. A method for measuring the waveguide film parameters by grating couplers[J]. Acta Optica Sinica, 1981, 1(3): 265
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