Bidirectional reflection distribution function (BRDF) in near infrared band can effectively characterize the reflection properties of materials and is widely used in computer modeling, remote sensing, aerospace, and other fields. In order to measure the BRDF value of near infrared band with high precision, a near infrared band BRDF measurement system is developed, and an absolute measurement scheme based on equal area luminance is proposed. The measurement system takes the center of the tested sample as the base point to re-model the spatial coordinate system of the measurement system, and uses the six-axis manipulator as the angle-changing device to realize the modeling, which can change the three-dimensional orientation of the sample without blind angles. The BRDF values of materials with any angle combination can be measured in 2π hemispheric space. The BRDF values of materials covering the near infrared band of 1000 nm to 3000 nm are measured with high precision. The system is used to measure the BRDF value of the standard diffuse reflection gold plate, and the results show that the relative uncertainty of the measurement result is 1.5%, indicating that the developed system has achieved high-precision measurement.