[4] Claps R, Englich F V, Leleux D P, et al. Applied Optics, 2001, 40(24): 4387.
[5] Wang Jian, Maiorov M, Jeffries J B. Measurement Science & Technology, 2000, 11: 1576.
[6] Chao Xing, Jeffries J B, Hanson R K. Proceedings of the Combustion Institute, 2013, 34(2): 3583.