• Chinese Journal of Lasers
  • Vol. 51, Issue 16, 1602208 (2024)
Yalei Zhang, Yunping Lan*, Jiayuan Han, Hongrong Zhang, and Yonggang Zou
Author Affiliations
  • State Key Laboratory of High Power Semiconductor Laser, Changchun University of Science and Technology, Changchun 130013, Jilin , China
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    DOI: 10.3788/CJL231276 Cite this Article Set citation alerts
    Yalei Zhang, Yunping Lan, Jiayuan Han, Hongrong Zhang, Yonggang Zou. Influence of Wet Etching Passivation on Surface Properties of Gallium Arsenide[J]. Chinese Journal of Lasers, 2024, 51(16): 1602208 Copy Citation Text show less
    PL spectra of samples etched by different acid solutions
    Fig. 1. PL spectra of samples etched by different acid solutions
    Effects of acid etching time and ODT-free solution on passivation. (a) PL spectra; (b) test maps by fast fluorescence spectrometer
    Fig. 2. Effects of acid etching time and ODT-free solution on passivation. (a) PL spectra; (b) test maps by fast fluorescence spectrometer
    SEM images. (a) GaAs substrate; (b) B4
    Fig. 3. SEM images. (a) GaAs substrate; (b) B4
    Effects of acid concentration in H2SO4 solution and H2O2-free solution on passivation. (a) PL spectra; (b) test maps by fast fluorescence spectrometer
    Fig. 4. Effects of acid concentration in H2SO4 solution and H2O2-free solution on passivation. (a) PL spectra; (b) test maps by fast fluorescence spectrometer
    Analysis results by Raman system. (a) GaAs substrate; (b) C2
    Fig. 5. Analysis results by Raman system. (a) GaAs substrate; (b) C2
    Test results by EDS. (a) GaAs substrate; (b) C2
    Fig. 6. Test results by EDS. (a) GaAs substrate; (b) C2
    SEM and AFM morphologies. (a) C2, SEM; (b) C3, SEM; (c) GaAs substrate, AFM; (d) C2, AFM; (e) C3, AFM
    Fig. 7. SEM and AFM morphologies. (a) C2, SEM; (b) C3, SEM; (c) GaAs substrate, AFM; (d) C2, AFM; (e) C3, AFM
    Test results for stability of passivation layer. (a) PL spectra; (b) test maps by fast fluorescence spectrometer
    Fig. 8. Test results for stability of passivation layer. (a) PL spectra; (b) test maps by fast fluorescence spectrometer
    Sample No.Acidic solutionTimePassivation condition
    A1V(H2SO4)∶V(H2O2)=1∶490 sIn ODT solution for 1 h
    A2V(HCl)∶V(H2O2)∶V(H2O)=1∶1∶690 sIn ODT solution for 1 h
    A3V(H2SO4)∶V(H2O2)=1∶4, V(HCl)∶V(H2O2)∶V(H2O)=1∶1∶690 sIn ODT solution for 1 h
    A4V(HCl)∶V(H2O2)∶V(H2O)=1∶1∶6, V(H2SO4)∶V(H2O2)=1∶490 sIn ODT solution for 1 h
    Table 1. Experimental scheme for acid etching
    Sample No.Acidic solution parameterTimePassivation condition
    B1

    V(H2SO4)∶V(H2O2)=1∶4

    and

    V(HCl)∶V(H2O2)∶V(H2O)=1∶1∶6

    60 sIn ODT solution for 1 h
    A390 sIn ODT solution for 1 h
    B2120 sIn ODT solution for 1 h
    B3180 sIn ODT solution for 1 h
    B490 sODT-free solution
    Table 2. Experimental scheme for effects of acid etching time and ODT-free solution on passivation
    Sample No.Acidic solution parameterTimePassivation condition
    A3V(H2SO4)∶V(H2O2)=1∶4 and V(HCl)∶V(H2O2)∶V(H2O)=1∶1∶690 sIn ODT solution for 1 h
    C1V(H2SO4)∶V(H2O2)∶V(H2O)=1∶4∶5 and V(HCl)∶V(H2O2)∶V(H2O)=1∶1∶690 sIn ODT solution for 1 h
    C2V(H2SO4)∶V(H2O2)∶V(H2O)=1∶4∶15 and V(HCl)∶V(H2O2)∶V(H2O)=1∶1∶690 sIn ODT solution for 1 h
    C3V(H2SO4)∶V(H2O)=1∶19 and V(HCl)∶V(H2O)=1∶790 sIn ODT solution for 1 h
    Table 3. Experimental scheme for effects of acid concentration in H2SO4 solution and H2O2-free solution on passivation
    Yalei Zhang, Yunping Lan, Jiayuan Han, Hongrong Zhang, Yonggang Zou. Influence of Wet Etching Passivation on Surface Properties of Gallium Arsenide[J]. Chinese Journal of Lasers, 2024, 51(16): 1602208
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