[5] Ramponi R, Marangoni M, Osellame R. Appl. Phys. Lett., 2001, 78(15): 2098.

[6] Schirmer O F, Thiemann O, Wohlecke M. J. Phys. Chem. Solids, 1991, 52(1): 185.

[7] Warren B E. X-ray Diffraction, Dover. New York, 1990.

[8] Hopper R W, Uhlmann D R. Journal of Applied Physics, 1970, 41: 4023.

[9] Glezer E N, Mazur E. Appl. Phys. Lett., 1997, 71: 882.

[10] Walker T W, Guenther A H, Nielsen P E. IEEE Journal of Quantum Electronics, 1981, QE-17(10): 2053.

[12] Feit M D, Rubenchik A M, Faux D R, et al. Proc. SPIE, 1997, 3047: 480.

[13] Yoo J H, Jeong S H, Greif R, et al. Appl. Phys., 2000, 88: 1638.

[14] Singh RK, Narayan J. Phys. Rev., 1990, B41(13): 8843.

[16] Alberto Salleo. High-Power Laser Damage in Fused Silica. Dissertation for the Ph. D. of University of California, Berkeley, 2001. 105.