• Infrared and Laser Engineering
  • Vol. 51, Issue 5, 20210391 (2022)
Wei Wu1、2, Zirong Luo1, Huizhe Yang2, Yujun Cao3, and Jianzhong Shang1
Author Affiliations
  • 1College of Intelligence and Science, National University of Defense Technology, Changsha 410073, China
  • 2College of Advanced Interdisciplinary Research, National University of Defense Technology, Changsha 410073, China
  • 3Academy of Hi-Tech Research, Hunan Institute of Traffic Engineering, Hengyang 421001, China
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    DOI: 10.3788/IRLA20210391 Cite this Article
    Wei Wu, Zirong Luo, Huizhe Yang, Yujun Cao, Jianzhong Shang. Misalignments calculation method for optical systems based on the ellipticity distribution of stellar image[J]. Infrared and Laser Engineering, 2022, 51(5): 20210391 Copy Citation Text show less
    Conventions for the pupil vector and field vector
    Fig. 1. Conventions for the pupil vector and field vector
    Stellar images for different assembly errors. (a) Without misalignments, and with misalignment in (b) x direction; (c) y direction and (d) x & y direction
    Fig. 2. Stellar images for different assembly errors. (a) Without misalignments, and with misalignment in (b) x direction; (c) y direction and (d) x & y direction
    Flow chart of misalignment calculation
    Fig. 3. Flow chart of misalignment calculation
    Optical layout of Hilbert optical system
    Fig. 4. Optical layout of Hilbert optical system
    Distribution of PSF and ellipticity under different misalignment status. (a) Case 1; (b) Case 2; (c) Case 3; (d) Case 4
    Fig. 5. Distribution of PSF and ellipticity under different misalignment status. (a) Case 1; (b) Case 2; (c) Case 3; (d) Case 4
    Distribution of ellipticity (a) e1, (b) e2 in ideal status
    Fig. 6. Distribution of ellipticity (a) e1, (b) e2 in ideal status
    Distribution of ellipticity (a) e1, (b) e2 in misaligned status
    Fig. 7. Distribution of ellipticity (a) e1, (b) e2 in misaligned status
    Distribution of ellipticity parameter (a) e1 and (b) e2 in the case of introduced II, distribution of ellipticity parameter (c) e1 and (d) e2 in the case of calculated II
    Fig. 8. Distribution of ellipticity parameter (a) e1 and (b) e2 in the case of introduced II, distribution of ellipticity parameter (c) e1 and (d) e2 in the case of calculated II
    Processes and results in the case of introduced II. (a) Variation of MF value with iteration times; (b) Distribution of particle swarm after the 1st iteration; (c) Distribution of particle swarm after the 15th iteration; (d) Output misalignment
    Fig. 9. Processes and results in the case of introduced II. (a) Variation of MF value with iteration times; (b) Distribution of particle swarm after the 1st iteration; (c) Distribution of particle swarm after the 15th iteration; (d) Output misalignment
    Misalignment calculation error in different SNR
    Fig. 10. Misalignment calculation error in different SNR
    SurfaceConicRadius/mmThickness/mmSemi-Diameter/mm
    PM−1.06−1291.2−485.5152.4
    SM−3.3095−425649.240
    Table 1. Design parameters for the Hilbert optical system
    TypeXDE/mmYDE/mmADE/(°)BDE/(°)
    Case 1[−0.50 +0.50]000
    Case 200[−0.50 +0.50]0
    Case 3[−0.50 +0.50]0.200
    Case 400[−0.50 +0.50]−0.2
    Table 2. Four cases of introduced misalignment status
    TypeXDE/mmYDE/mmADE/(°)BDE/(°)
    Introduced I0.20000.37000.2500−0.1300
    Calculated I0.19960.37030.2501−0.1297
    Error I0.0004−0.0003−0.0001−0.0003
    Introduced II0.04000.03700.0250−0.0130
    Calculated II0.04030.03710.0248−0.0128
    Error II−0.0003−0.00010.0002−0.0002
    Table 3. Introduced misalignments and calculated results
    Wei Wu, Zirong Luo, Huizhe Yang, Yujun Cao, Jianzhong Shang. Misalignments calculation method for optical systems based on the ellipticity distribution of stellar image[J]. Infrared and Laser Engineering, 2022, 51(5): 20210391
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