• Acta Optica Sinica
  • Vol. 39, Issue 10, 1034002 (2019)
Junqin Li1、2, Zhenhua Chen1、2, Zilong Zhao1、2, Ying Zou1、2、*, Yong Wang1、2、**, and Renzhong Tai1、2、***
Author Affiliations
  • 1Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2Shanghai Synchrotron Radiation Facility, Zhangjiang Laboratory, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China
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    DOI: 10.3788/AOS201939.1034002 Cite this Article Set citation alerts
    Junqin Li, Zhenhua Chen, Zilong Zhao, Ying Zou, Yong Wang, Renzhong Tai. Soft X-Ray Absorption Spectroscopy of Low Z Element Based on Fluorescence Emission[J]. Acta Optica Sinica, 2019, 39(10): 1034002 Copy Citation Text show less

    Abstract

    We establish a measurement system based on low atomic number absorption spectrum of fluorescence emission via the beamline station 08U1A of Shanghai Synchrotron Radiation Source, and explore the partial fluorescence yield (PFY) based on absorption method. The feasibility and applicability of this setup is verified on low Z elements in soft condensed matter and semiconductor areas. The research objects of CF4 gas and iodine methylamine lead (CH3NH3PbI3) verify the feasibility of PFY absorption spectroscopy. Then the low limit of sensitivity to sample concentration is determined.
    Junqin Li, Zhenhua Chen, Zilong Zhao, Ying Zou, Yong Wang, Renzhong Tai. Soft X-Ray Absorption Spectroscopy of Low Z Element Based on Fluorescence Emission[J]. Acta Optica Sinica, 2019, 39(10): 1034002
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