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    Journals >Acta Optica Sinica >Volume 7 >Issue 9 >Page 838 > Article
    • Acta Optica Sinica
    • Vol. 7, Issue 9, 838 (1987)
    Determination of refractive index and thickness of a low index thin film by leaky waveguide technique
    WU QIHONG
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    WU QIHONG. Determination of refractive index and thickness of a low index thin film by leaky waveguide technique[J]. Acta Optica Sinica, 1987, 7(9): 838 Copy Citation Text show less
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    WU QIHONG. Determination of refractive index and thickness of a low index thin film by leaky waveguide technique[J]. Acta Optica Sinica, 1987, 7(9): 838
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