• Infrared and Laser Engineering
  • Vol. 44, Issue 7, 2050 (2015)
Chen Lin, Yang Li, Fan Chunli, Shi Hongchen, and Zhao Xiaolong
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    Chen Lin, Yang Li, Fan Chunli, Shi Hongchen, Zhao Xiaolong. Quantitative identification of coating thickness and debonding defects of TBC by pulse phase technology[J]. Infrared and Laser Engineering, 2015, 44(7): 2050 Copy Citation Text show less
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    CLP Journals

    [1] Guo Wei, Dong Lihong, Wang Haidou, Xu Yawei, Xu Binshi. Phase spectra extract of thermal wave with wavelet decomposition and coating thickness estimation[J]. Infrared and Laser Engineering, 2017, 46(9): 904003

    Chen Lin, Yang Li, Fan Chunli, Shi Hongchen, Zhao Xiaolong. Quantitative identification of coating thickness and debonding defects of TBC by pulse phase technology[J]. Infrared and Laser Engineering, 2015, 44(7): 2050
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