• Opto-Electronic Engineering
  • Vol. 36, Issue 6, 63 (2009)
HAN Xue-bing1、*, ZHANG Jing-xu2, WANG Zhi2, ZHAO Jin-yu2, ZHAO Yong-zhi1, and WU Xiao-xia2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2009.06.013 Cite this Article
    HAN Xue-bing, ZHANG Jing-xu, WANG Zhi, ZHAO Jin-yu, ZHAO Yong-zhi, WU Xiao-xia. Research of Alt-alt Photoelectric Telescope Sighting Error Measurement[J]. Opto-Electronic Engineering, 2009, 36(6): 63 Copy Citation Text show less
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    [1] Richardson E H,Grundmann W A,Odgers G J. Altitude-altitude mounting for an 8-m telescope [J]. Proceedings of SPIE (S0277-786X),1990,1236:897-904.

    [2] Stefan S,Rodrigo A,Philippe D,et al. VLT astronomical site monitor: control, automation, and data flow [J]. Proceedings of SPIE(S0277-786X),2000,4009:338-349.

    [3] PING Yi-ding,ZHANG Xiao-xiang,LU Chun-lin. Static Pointing Model of 65 cm Level Mounting Telescope[J]. ACTA Astronomica Sinica,2006,47(2):224-230.

    [4] ZHANG Yao-ming,ZOU Li-xin,SHEN Jiang. Main feature analysis of photoelectric theodolite of horizon type [J]. Journal of Suzhou University: Natural Science,2002,18(2):21-24.

    [5] HE Zhao-cai,HU bao-an,DONG shu-fa,et al. Optical-electric Measurement [M]. Beijing:National Defense Industry Press,2002:76-85.

    [6] LING Xin-chang,DENG You-jun,CHEN Ling-qiang. Detecting the Static Systematic Errors of Satellite Theodolites in Seven Astronomical Observations of Stations [J]. Publications of Yunnan Observatory,1999(4):48-52.

    [7] GB/T3161 2003. Optical Theodolite [S]. Beijing:Chinese Standard Press,2003:18-19.

    [8] ZHAO Xue-yan,LI Ying-chun. Optical Measurement in Range [M]. Beijing:The Academy of Eqipment Comand and Technology,2000.

    [9] ZHAO Jin-yu,WANG Jian-li. Shafting errors of horizontal telescope [J]. Optics and Precision Engineering,2008,16(5):177-180

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    HAN Xue-bing, ZHANG Jing-xu, WANG Zhi, ZHAO Jin-yu, ZHAO Yong-zhi, WU Xiao-xia. Research of Alt-alt Photoelectric Telescope Sighting Error Measurement[J]. Opto-Electronic Engineering, 2009, 36(6): 63
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