Separation Method of Overlapping Phase-Shift Gratings in Three-Dimensional Measurement of Double Projection Structured Light

Jingxiang Bai; Xinghua Qu; Wei Feng; Fumin Zhang

doi:10.3788/AOS201838.1112002

Journals >Acta Optica Sinica >Volume 38 >Issue 11 >Page 1112002 > Article

Acta Optica Sinica
Vol. 38, Issue 11, 1112002 (2018)

Separation Method of Overlapping Phase-Shift Gratings in Three-Dimensional Measurement of Double Projection Structured Light

Jingxiang Bai^1、*, Xinghua Qu¹, Wei Feng², and Fumin Zhang^1、*

Author Affiliations

¹ National Key Laboratory of Precision Testing Techniques and Instrument, Tianjin University, Tianjin 300072, China

² School of Mechanical Engineering, Hubei University of Technology, Wuhan, Hubei 430068, China

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DOI: 10.3788/AOS201838.1112002 Cite this Article Set citation alerts

Jingxiang Bai, Xinghua Qu, Wei Feng, Fumin Zhang. Separation Method of Overlapping Phase-Shift Gratings in Three-Dimensional Measurement of Double Projection Structured Light[J]. Acta Optica Sinica, 2018, 38(11): 1112002 Copy Citation Text

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References

CLP Journals

[1] CAI Ning, CHEN Zhe-bo, LIN Bin, CAO Xiang-qun. Genetic Method to Optimize Dithering Technique in Phase Domain for High-quality Binary Fringe Generation[J]. Acta Photonica Sinica, 2019, 48(8): 811002

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