• Infrared and Laser Engineering
  • Vol. 46, Issue 9, 917001 (2017)
Liu Dong1, Yan Tianliang1, Wang Daodang2, Yang Yongying1, and Huang Wei3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.3788/irla201746.0917001 Cite this Article
    Liu Dong, Yan Tianliang, Wang Daodang, Yang Yongying, Huang Wei. Review of fringe-projection profilometry and phase measuring deflectometry[J]. Infrared and Laser Engineering, 2017, 46(9): 917001 Copy Citation Text show less

    Abstract

    Fringe-projection profilometry and phase measuring deflectometry can realize high accurate measurement of three-dimensional shape, which has good development prospect in the full field three-dimensional profilometry. First, the measuring principles of fringe-projection profilometry and phase measuring deflectometry were introduced. Moreover, the technologies of phase extracting and camera calibration in fringe-projection profilometry and phase measuring deflectometry were also especially emphasized, which were key technologies. Then the similarities and differences of fringe-projection profilometry and phase measuring deflectometry were compared. What′s more, the development direction and problems to be solved of enhancing the measurement accuracy and speed in fringe-projection profilometry and phase measuring deflectometry were introduced. In order to improve the measurement accuracy, main methods can be divided as follows: correcting the the Gamma effect of a digital projector and a digital camera, improving the phase extraction accuracy of the fringes, enhancing the camera calibration accuracy, phase-height/gradient calibration accuracy and other means. In order to improve the measurement speed, the phase extraction speed and the phase unwrapping speed were improved.
    Liu Dong, Yan Tianliang, Wang Daodang, Yang Yongying, Huang Wei. Review of fringe-projection profilometry and phase measuring deflectometry[J]. Infrared and Laser Engineering, 2017, 46(9): 917001
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