Measurement of the spatial coherence of hard synchrotron radiation using a pencil beam

Wenqiang Hua; Guangzhao Zhou; Yuzhu Wang; Ping Zhou; Shumin Yang; Chuanqian Peng; Fenggang Bian; Xiuhong Li; Jie Wang

doi:10.3788/COL201715.033401

Journals >Chinese Optics Letters >Volume 15 >Issue 3 >Page 033401 > Article

Chinese Optics Letters
Vol. 15, Issue 3, 033401 (2017)

Measurement of the spatial coherence of hard synchrotron radiation using a pencil beam

Wenqiang Hua¹, Guangzhao Zhou¹, Yuzhu Wang¹, Ping Zhou¹, Shumin Yang¹, Chuanqian Peng², Fenggang Bian¹, Xiuhong Li¹, and Jie Wang^1、*

Author Affiliations

¹Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201204, China

²School of Optoelectronic Information, Chongqing University of Technology, Chongqing 400050, China

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DOI: 10.3788/COL201715.033401 Cite this Article Set citation alerts

Wenqiang Hua, Guangzhao Zhou, Yuzhu Wang, Ping Zhou, Shumin Yang, Chuanqian Peng, Fenggang Bian, Xiuhong Li, Jie Wang. Measurement of the spatial coherence of hard synchrotron radiation using a pencil beam[J]. Chinese Optics Letters, 2017, 15(3): 033401 Copy Citation Text

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$Expansion ratio (blue circles) and visibility (red squares) plotted against the cl/L value obtained for the beam diameter L=4 μm, wavelength λ=0.15 nm, and detector distance z=1.5 m. (Inset) Normalized diffraction profiles displayed for various cl values.$

Fig. 1. Expansion ratio (blue circles) and visibility (red squares) plotted against the cl/L value obtained for the beam diameter L=4 μm, wavelength λ=0.15 nm, and detector distance z=1.5 m. (Inset) Normalized diffraction profiles displayed for various cl values.

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Schematic diagram of the experimental setup at the SSRF BL19U2 beamline. The inset in the lower left corner is a scanning electron microscope image of the center portion of the grating.

Fig. 2. Schematic diagram of the experimental setup at the SSRF BL19U2 beamline. The inset in the lower left corner is a scanning electron microscope image of the center portion of the grating.

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$Measured diffraction patterns obtained with a secondary source slit size of (a) 100 μm×100 μm and (b) 200 μm×200 μm for a horizontally placed grating. (c) The normalized intensity profiles for the second- and third-order diffraction peaks of the gratings along the horizontal direction.$

Fig. 3. Measured diffraction patterns obtained with a secondary source slit size of (a) 100 μm×100 μm and (b) 200 μm×200 μm for a horizontally placed grating. (c) The normalized intensity profiles for the second- and third-order diffraction peaks of the gratings along the horizontal direction.

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$Measured diffraction patterns obtained with a secondary source slit size of (a) 100 μm×100 μm and (b) 200 μm×200 μm for a vertically placed grating. (c) The normalized intensity profiles for the second- and third-order diffraction peaks of the gratings along the vertical direction.$

Fig. 4. Measured diffraction patterns obtained with a secondary source slit size of (a) 100 μm×100 μm and (b) 200 μm×200 μm for a vertically placed grating. (c) The normalized intensity profiles for the second- and third-order diffraction peaks of the gratings along the vertical direction.

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	Horizontal		Vertical
Secondary source slit size (μm)	100	200	100	200
$σ_{coh}$ (μm)	20.45
$σ_{m}$ (μm)	34.87	49.77	28.87	35.41
$σ_{F μ}$ (μm)	28.23	45.38	20.38	28.91
Expansion ratio	1.71	2.43	1.41	1.73
Visibility	$7.79 \times 10^{- 4}$	$9.50 \times 10^{- 9}$	$2.41 \times 10^{- 2}$	$5.54 \times 10^{- 4}$
$c l$ (μm)	3.44	2.14	4.76	3.36

Table 1. Measured Beam Parameters of BL19U2 With a 13 μm Pinhole, Grating Period of 200 nm, Photon Energy of 12 keV, and Secondary Source Slit Sizes of 100 μm×100 μm and 200 μm×200 μm

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	Horizontal		Vertical
Beam size at the source 0 m (μm)	154		9.79
Transverse coherence length at the source (μm)	0.47		1.24
Beam size at the KB mirror (μm)	1073	at 31.2 m	434	at 34 m
Transverse coherence length at the KB mirror (μm)	3.249	at 31.2 m	55.4	at 34 m
Degree of coherence	0.0015		0.0637
Beam size at the secondary source slit 41 m (μm)	656		296
Transverse coherence length at secondary source slit (μm)	1.99		37.8
Secondary source slit size (μm)	100	200	100	200
Beam size at the sample 50 m (μm)	74.3	80.4	17.4	33.0
Transverse coherence length at the sample (μm)	3.48	1.89	15.6	15.2
Degree of coherence after secondary source slit	0.023	0.012	0.409	0.225