• Infrared and Laser Engineering
  • Vol. 49, Issue S1, 20200108 (2020)
Sun Haizhu1, Zhang Jianxin1、2, Fan Xinmin1、2, Sun Yongzhi2, and Li Sensen3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.3788/irla20200108 Cite this Article
    Sun Haizhu, Zhang Jianxin, Fan Xinmin, Sun Yongzhi, Li Sensen. All-dielectric frequency selective metasurface based on slotted resonance unit[J]. Infrared and Laser Engineering, 2020, 49(S1): 20200108 Copy Citation Text show less

    Abstract

    In order to obtain new resonance modes for frequency selection of the metasurface, one or two slits were introduced into the all-dielectric resonance unit, all-dielectric frequency selective metasurface based on this type resonance unit was designed by using the local characteristics of electromagnetic field by slit. After simulating its transmission characteristics, it was found that when the long side of the slit and the direction of the incident electric field were the same, a stop band could appear at the low frequency, and the electromagnetic field was mainly distributed between the resonance units. When the long side of the slit was perpendicular to the direction of the incident electric field, a stopband and a passband could appear at the high frequency. Meanwhile, with the increase of the resonance frequency, the local characteristics of the electromagnetic field were more obvious and were better limited within the slit. By adjusting the width, number and spacing of slits, the operating frequency of the metasurface could be adjusted in a large frequency range. At the same time, the relative position of the slit and incident electric field could be changed by rotation to realize the reconfiguration of the metasurface. These theoretical results provide important theoretical guidance for the design of more complex resonant units based on slit.
    Sun Haizhu, Zhang Jianxin, Fan Xinmin, Sun Yongzhi, Li Sensen. All-dielectric frequency selective metasurface based on slotted resonance unit[J]. Infrared and Laser Engineering, 2020, 49(S1): 20200108
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