A Single Event Effect Test System for Analog-to-Digital Converter with Static Inputs

LIU Tao; QI Feitao; ZHU Beili; ZHANG Lin; LIU Hainan; TENG Rui; LI Bo; ZHAO Fazhan; LUO Jiajun; HAN Zhengsheng

doi:10.13911/j.cnki.1004-3365.zjea014

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