• Journal of Infrared and Millimeter Waves
  • Vol. 37, Issue 3, 325 (2018)
HOU Zhi-Jin1、2、3, FU Li1, LU Zheng-Xiong2、3, SI Jun-Jie2、3, WANG Wei2、3, and LV Yan-Qiu2、3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.11972/j.issn.1001-9014.2018.03.012 Cite this Article
    HOU Zhi-Jin, FU Li, LU Zheng-Xiong, SI Jun-Jie, WANG Wei, LV Yan-Qiu. Causes and characteristics of indium bump defects in InSb focal plane array[J]. Journal of Infrared and Millimeter Waves, 2018, 37(3): 325 Copy Citation Text show less
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    HOU Zhi-Jin, FU Li, LU Zheng-Xiong, SI Jun-Jie, WANG Wei, LV Yan-Qiu. Causes and characteristics of indium bump defects in InSb focal plane array[J]. Journal of Infrared and Millimeter Waves, 2018, 37(3): 325
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