Elimination of optical aberrations by use of speckle imaging

[in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 32 >Issue 10 >Page 47 > Article

Opto-Electronic Engineering
Vol. 32, Issue 10, 47 (2005)

Elimination of optical aberrations by use of speckle imaging

[in Chinese]^1、2、3 and [in Chinese]¹

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¹[in Chinese]

²[in Chinese]

³[in Chinese]

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[in Chinese], [in Chinese]. Elimination of optical aberrations by use of speckle imaging[J]. Opto-Electronic Engineering, 2005, 32(10): 47 Copy Citation Text

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References

[1] LABEYRIE. Attainment of diffraction-limited resolution in large telescope by Fourier-analyzing speckle patters in star images [J]. Astron. Astrophys,1970,6:85-87.

[3] K.T. KNOX,B. J. THOMPSON. Recovery of images from atmospherically degraded short exposure photographs [J]. Astrophys.J,1974,193:L45-L48.

[4] R. V. STACHNIK,P. NISENSON,D. C. EHN,et al. Speckle image reconstruction of solar features [J].Nature,1977,266:149-151.

[5] Daniel MALACARA. Optical Shop Testing [M]. New York:John Wiley&Sons, Inc.,1978. 461.

[7] K. T. KNOX. Image retrieval from astronomical speckle patterns [J]. J. Opt. Soc. Am,1976,66:1236-1239.

[in Chinese], [in Chinese]. Elimination of optical aberrations by use of speckle imaging[J]. Opto-Electronic Engineering, 2005, 32(10): 47

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