GUO Li, ZHOU Jianyong, HE Da, HE Changhai, YIN Jun, TANG Zunlie, YUAN Shishun. Design of Automated Test System for Leakage Current between Electrodes of CCD Image Sensor[J]. Semiconductor Optoelectronics, 2020, 41(2): 287

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- Semiconductor Optoelectronics
- Vol. 41, Issue 2, 287 (2020)
Abstract

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