• Infrared and Laser Engineering
  • Vol. 49, Issue 8, 20190533 (2020)
Heng An1, Detian Li1、*, Xuan Wen1, Chenguang Zhang1, Yi Wang1, Kuian Ma2, Cunhui Li1, Yuxiong Xue1, Shengsheng Yang1, and Zhou Cao1
Author Affiliations
  • 1National Key Laboratory of Materials Behavior and Evaluation Technology in Space Environment, Lanzhou Institute of Physics, Science and Technology on Vacuum Technology and Physics Laboratory, Lanzhou 730000, China
  • 2China Academy of Space Technology, Xi''an 710000, China
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    DOI: 10.3788/IRLA20190533 Cite this Article
    Heng An, Detian Li, Xuan Wen, Chenguang Zhang, Yi Wang, Kuian Ma, Cunhui Li, Yuxiong Xue, Shengsheng Yang, Zhou Cao. Simulation test study of single event transient effect for high speed PWM with pulse laser[J]. Infrared and Laser Engineering, 2020, 49(8): 20190533 Copy Citation Text show less
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    [9] R L Pease, A L Sternberg, Y Boulghassoul. Comparison of SET’s in bipolar linear circuits generated with an ion microbeam, laser light and circuit simulation. IEEE Transactions on Nuclear Science, 49, 3163-3170(2002).

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    [13] D Chen, S Buchner, A Phan. The effects of elevated temperature on pulsed-laser induced single event transients in analog devices. IEEE Transactions on Nuclear Science, 56, 3138-3140(2009).

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    [15] Heng An, 安恒, 张晨光, Chenguang Zhang, 杨生胜, Shengsheng Yang. Investigation of single event transients on SiGe BiCMOS linear devices with pulsed laser. Infrared and Laser Engineering, 48, 0320001(2019).

    Heng An, Detian Li, Xuan Wen, Chenguang Zhang, Yi Wang, Kuian Ma, Cunhui Li, Yuxiong Xue, Shengsheng Yang, Zhou Cao. Simulation test study of single event transient effect for high speed PWM with pulse laser[J]. Infrared and Laser Engineering, 2020, 49(8): 20190533
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