[6] Yuguang Jiang, 姜昱光, 封国强, Guoqiang Feng, 朱翔, Xiang Zhu. PuIsed laser method for see testing in FPGAs. Atomic Energy Science and Technology, 46, 582-586(2012).
[10] 王德坤, Dekun Wang, 曹洲, Zhou Cao, Hainan Liu, 刘海南. Backside piuse laser testing for single event effect. Atomic Energy Science and Technology, 45, 884-887(2011).
[11] 赵雯, Wen Zhao, Hongxia Guo, 郭红霞, Fengqi Zhang, 张凤祁. Development of measurement system for single event effect on pulse width modulator. Atomic Energy Science and Technology, 48, 717-722(2014).
[14] Larsson S, Mattsson S. Heavy ion effects in PWM’s of the types UCC1806 UC1825A[R]. ESA_QCA0417S_C, 2005.