• Opto-Electronic Engineering
  • Vol. 47, Issue 8, 200209 (2020)
Hou Xi1、*, Zhang Shuai1、2, Hu Xiaochuan1, Quan Haiyang1, Wu Gaofeng1, Jia Xin1, He Yiwei1, Chen Qiang1, and Wu Fan1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.12086/oee.2020.200209 Cite this Article
    Hou Xi, Zhang Shuai, Hu Xiaochuan, Quan Haiyang, Wu Gaofeng, Jia Xin, He Yiwei, Chen Qiang, Wu Fan. The research progress of surface interferometric measurement with higher accuracy[J]. Opto-Electronic Engineering, 2020, 47(8): 200209 Copy Citation Text show less
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    CLP Journals

    [1] Zhang Shuai, Quan Haiyang, Hou Xi, Hu Xiaochuan, Wu Gaofeng. Absolute testing of planarity and inhomogeneity with modified six-step method[J]. Opto-Electronic Engineering, 2021, 48(7): 210047

    Hou Xi, Zhang Shuai, Hu Xiaochuan, Quan Haiyang, Wu Gaofeng, Jia Xin, He Yiwei, Chen Qiang, Wu Fan. The research progress of surface interferometric measurement with higher accuracy[J]. Opto-Electronic Engineering, 2020, 47(8): 200209
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