• Acta Optica Sinica
  • Vol. 43, Issue 10, 1031001 (2023)
Liangchao Fan, Zhi Huang, Quanjiang Lü*, Guiwu Liu, Guanjun Qiao, and Junlin Liu**
Author Affiliations
  • School of Materials Science and Engineering, Jiangsu University, Zhenjiang 212013, Jiangsu, China
  • show less
    DOI: 10.3788/AOS222038 Cite this Article Set citation alerts
    Liangchao Fan, Zhi Huang, Quanjiang Lü, Guiwu Liu, Guanjun Qiao, Junlin Liu. Effect of Two-Step Annealing on Optoelectronic Properties of Lead Sulfide Thin Films[J]. Acta Optica Sinica, 2023, 43(10): 1031001 Copy Citation Text show less
    XRD patterns of samples S1-S6
    Fig. 1. XRD patterns of samples S1-S6
    Optical microscope surface morphologies of samples S1-S6. (a) Sample S1; (b) sample S2; (c) sample S3; (d) sample S4; (e) sample S5; (f) sample S6
    Fig. 2. Optical microscope surface morphologies of samples S1-S6. (a) Sample S1; (b) sample S2; (c) sample S3; (d) sample S4; (e) sample S5; (f) sample S6
    SEM surface morphologies of samples S1-S6. (a) Sample S1; (b) sample S2; (c) sample S3; (d) sample S4; (e) sample S5; (f) sample S6
    Fig. 3. SEM surface morphologies of samples S1-S6. (a) Sample S1; (b) sample S2; (c) sample S3; (d) sample S4; (e) sample S5; (f) sample S6
    Schematic diagram of optoelectronic property test and optoelectronic properties of PbS thin films at different optical power densities. (a) Schematic diagram of optoelectronic property test; (b) Iph; (c) R; (d) D*
    Fig. 4. Schematic diagram of optoelectronic property test and optoelectronic properties of PbS thin films at different optical power densities. (a) Schematic diagram of optoelectronic property test; (b) Iph; (c) R; (d) D*
    Thicknesses and optoelectronic properties of PbS thin films. (a) Thicknesses of samples S1-S6; (b) Idark of samples S2-S6;(c) R of samples S2-S6; (d) D* of samples S2-S6
    Fig. 5. Thicknesses and optoelectronic properties of PbS thin films. (a) Thicknesses of samples S1-S6; (b) Idark of samples S2-S6;(c) R of samples S2-S6; (d) D* of samples S2-S6
    Response diagram of sample S5 at high frequency. (a) Normalized response curve at 4 kHz; (b) partial magnification of Fig. 6(a)
    Fig. 6. Response diagram of sample S5 at high frequency. (a) Normalized response curve at 4 kHz; (b) partial magnification of Fig. 6(a)
    Liangchao Fan, Zhi Huang, Quanjiang Lü, Guiwu Liu, Guanjun Qiao, Junlin Liu. Effect of Two-Step Annealing on Optoelectronic Properties of Lead Sulfide Thin Films[J]. Acta Optica Sinica, 2023, 43(10): 1031001
    Download Citation