• Opto-Electronic Engineering
  • Vol. 46, Issue 12, 180549 (2019)
Xue Xiaoliang1, Su Haibing1、2、*, Shu Huailiang1, Guo Shuai1, and Wu Wei1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.12086/oee.2019.180549 Cite this Article
    Xue Xiaoliang, Su Haibing, Shu Huailiang, Guo Shuai, Wu Wei. Research on fault injection system of FPGA in irradiation environment[J]. Opto-Electronic Engineering, 2019, 46(12): 180549 Copy Citation Text show less

    Abstract

    This article studied the frame structure of Xilinx FPGA configuration RAM, giving the method of extracting the frame structure and providing the order of frames in the bit stream file. The structure of the intermediate file of SEM IP core is also analyzed to get the positions of essential bits. Performing 0/1 flipping on the essential bits is a way to simulate the single event upset which the circuit is sensitive to under the radiation environment. A PC-side interface is designed to implement a human-machine interaction. The fault injection system is implemented on the FPGA chip, and the read and write of configuration RAM data are realized through ICAP without the need of the processor. The operation of flipping and repairing test classifies essential bits into some categories. The classification results can be used to protect the key bits in subsequent fault repairing.
    Xue Xiaoliang, Su Haibing, Shu Huailiang, Guo Shuai, Wu Wei. Research on fault injection system of FPGA in irradiation environment[J]. Opto-Electronic Engineering, 2019, 46(12): 180549
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