Simulation of Coherent Diffraction Imaging Based on Scanning Transimission X-Ray Microscopy of Shanghai Synchrotron Radiation Facility

Tan Xingxing; Liu Haigang; Guo Zhi; Wu Yanqing; Xu Zijian; Wang Yong; Tai Renzhong

doi:10.3788/aos201131.0418001

Journals >Acta Optica Sinica >Volume 31 >Issue 4 >Page 418001 > Article

Acta Optica Sinica
Vol. 31, Issue 4, 418001 (2011)

Simulation of Coherent Diffraction Imaging Based on Scanning Transimission X-Ray Microscopy of Shanghai Synchrotron Radiation Facility

Tan Xingxing^*, Liu Haigang, Guo Zhi, Wu Yanqing, Xu Zijian, Wang Yong, and Tai Renzhong

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[in Chinese]

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DOI: 10.3788/aos201131.0418001 Cite this Article Set citation alerts

Tan Xingxing, Liu Haigang, Guo Zhi, Wu Yanqing, Xu Zijian, Wang Yong, Tai Renzhong. Simulation of Coherent Diffraction Imaging Based on Scanning Transimission X-Ray Microscopy of Shanghai Synchrotron Radiation Facility[J]. Acta Optica Sinica, 2011, 31(4): 418001 Copy Citation Text

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