Author Affiliations
1Key Laboratory of Beam Control, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, Sichuan 610209, China2University of Chinese Academy of Sciences, Beijing 100049, Chinashow less
Fig. 1. Principle of Shack-Hartmann sensor
[4]. (a) Spots of flat wavefront; (b) spots of wavefront with aberration
Fig. 2. Diagram of testing process of single sub-aperture
Fig. 3. Mirror area covered by sub-apertures
Fig. 4. Structure of Cassegrain system
Fig. 5. Initial aberration of the system
Fig. 6. Variation of RMS relative error with the order of aberration
Fig. 7. Recovery effect comparison of different order aberrations. (a) Recovery wavefront of the 8th-order aberration; (b) reference wavefront of the 8th-order aberration; (c) recovery wavefront of the 29th-order aberration; (d) reference wavefront of the 29th-order aberration
Fig. 8. Detection effect of low-order aberrations. (a) Reference aberration; (b) recovery aberration
Fig. 9. Detection results while adding high-order aberrations. (a) Recovery wavefront; (b) reference wavefront; (c) low-order residual; (d) high-order residual
Fig. 10. Three distribution types of sub-aperture. (a) Sparse sub-aperture distribution; (b) tangent sub-aperture distribution; (c) intensive sub-aperture distribution
Fig. 11. Recovery effect comparison of different sub-aperture distribution types. (a) Reference aberration introduced by the Zernike surface type; (b) recovery wavefront of sparse sub-aperture distribution; (c) recovery wavefront of tangent sub-aperture distribution; (d) recovery wavefront of intensive sub-aperture distribution
Fig. 12. Detection error curves under different sub-aperture numbers. (a) RMS relative error; (b) PV relative error
Fig. 13. Fitting curve of detection error with the number of sub-apertures