• Journal of Infrared and Millimeter Waves
  • Vol. 29, Issue 6, 431 (2010)
MENG Qing-Duan1、2、*, LV Yan-Qiu2, LU Zheng-Xiong2, and SUN Wei-Guo2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    MENG Qing-Duan, LV Yan-Qiu, LU Zheng-Xiong, SUN Wei-Guo. STRESS IN InSb INFRARED FOCAL PLANE ARRAY DETECTOR ANALYZED WITH ANSYS[J]. Journal of Infrared and Millimeter Waves, 2010, 29(6): 431 Copy Citation Text show less
    References

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    [6] Wilde J, Becker K, Thoben M, et al. Rate dependent constitutive relations based on Anand model for 92.5Pb5Sn2.5Ag solder[J]. IEEE Transactions on Advanced Packaging,2000,23(3):408—414.

    [7] Chang R W, Patrick Mccluskey F. Constitutive relations of indium in extreme-temperature electronic packaging based on Anand model[J]. Journal of Electronic Materials,2009,38(9):1855—1859.

    [8] Kim S, Ledbetter H. Low-temperature elastic coefficients of polycrystalline indium[J]. Materials Science and Engineering A,1998,252(1):139—143.

    [9] Hermida E B, Melo D G, Aguiar J C, et al. Temperature dependence of the viscoelastic response of In, Sn and In-Sn alloys[J]. Journal of Alloys and Compounds,2000,310(1):91—96.

    [10] Reed R P, Mc Cowan C N, Walsh R P. Tensile strength and ductility of indium[J]. Materials Science and Engineering,1988,102(2):227—236.

    MENG Qing-Duan, LV Yan-Qiu, LU Zheng-Xiong, SUN Wei-Guo. STRESS IN InSb INFRARED FOCAL PLANE ARRAY DETECTOR ANALYZED WITH ANSYS[J]. Journal of Infrared and Millimeter Waves, 2010, 29(6): 431
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