• Acta Photonica Sinica
  • Vol. 49, Issue 3, 0322001 (2020)
Jun SHI1, Miao LI2, Lin-dong-ying LUO1, Feng WANG3, Guo-hong YANG3, and Min-xi WEI3
Author Affiliations
  • 1Key Laboratory of Optoelectronic Technology and Systems of the Education Ministry of China, Chongqing University, Chongqing 400044, China
  • 2College of Optoelectronic Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065, China
  • 3Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang, Sichuan 621900 China
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    DOI: 10.3788/gzxb20204903.0322001 Cite this Article
    Jun SHI, Miao LI, Lin-dong-ying LUO, Feng WANG, Guo-hong YANG, Min-xi WEI. An X-ray Detection Technology with Multi-curvature Bent Crystal[J]. Acta Photonica Sinica, 2020, 49(3): 0322001 Copy Citation Text show less
    Imaging structure of conical crystal spectrograph
    Fig. 1. Imaging structure of conical crystal spectrograph
    The formation of two cones
    Fig. 2. The formation of two cones
    Reflection of an X-ray from the multi-curvature bent crystal surface
    Fig. 3. Reflection of an X-ray from the multi-curvature bent crystal surface
    X-ray path in xoz plane with the reflection point offset of Δz
    Fig. 4. X-ray path in xoz plane with the reflection point offset of Δz
    Schematic of the reflection point moving along negative z axis
    Fig. 5. Schematic of the reflection point moving along negative z axis
    Schematic of the source, bent crystal and detector
    Fig. 6. Schematic of the source, bent crystal and detector
    X-ray spectrum obtained by CMOS camera
    Fig. 7. X-ray spectrum obtained by CMOS camera
    Distribution of spectral intensity
    Fig. 8. Distribution of spectral intensity
    Image of image plate recording Ti target shot
    Fig. 9. Image of image plate recording Ti target shot
    Jun SHI, Miao LI, Lin-dong-ying LUO, Feng WANG, Guo-hong YANG, Min-xi WEI. An X-ray Detection Technology with Multi-curvature Bent Crystal[J]. Acta Photonica Sinica, 2020, 49(3): 0322001
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