• Acta Photonica Sinica
  • Vol. 49, Issue 3, 0322001 (2020)
Jun SHI1, Miao LI2, Lin-dong-ying LUO1, Feng WANG3, Guo-hong YANG3, and Min-xi WEI3
Author Affiliations
  • 1Key Laboratory of Optoelectronic Technology and Systems of the Education Ministry of China, Chongqing University, Chongqing 400044, China
  • 2College of Optoelectronic Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065, China
  • 3Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang, Sichuan 621900 China
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    DOI: 10.3788/gzxb20204903.0322001 Cite this Article
    Jun SHI, Miao LI, Lin-dong-ying LUO, Feng WANG, Guo-hong YANG, Min-xi WEI. An X-ray Detection Technology with Multi-curvature Bent Crystal[J]. Acta Photonica Sinica, 2020, 49(3): 0322001 Copy Citation Text show less

    Abstract

    In the spectrum diagnostic physics experiment of inertial confinement fusion, the spectral signal is weak due to the X-ray diffraction efficiency with crystal. So a spectral diagnostic instrument with high light collection efficiency and wide spectral range is urgently needed. A multi-curvature bent crystal multi-energy point imaging technique is proposed based on traditional conical crystal structure. It has the characteristics of wide spectral range, strong focusing ability and high spectral resolution. At the same time, it can eliminate imaging aberration in principle due to the rotational symmetry of imaging light. The measuring spectra experiment of multi-curvature bent α-quartz crystal is conducted at a Ti X-ray tube device and the same experiment with plane α-quartz crystal is done to demonstrate the strong focusing ability. The result shows that the intensity of multi-curvature bent α-quartz crystal is 100 times than that of plane crystal, and the energy range of detected X-ray is 4.51~5.14 keV. This device combined with a streak camera at a vertical direction could be used to collect weak X-ray with wide spectral range.
    Jun SHI, Miao LI, Lin-dong-ying LUO, Feng WANG, Guo-hong YANG, Min-xi WEI. An X-ray Detection Technology with Multi-curvature Bent Crystal[J]. Acta Photonica Sinica, 2020, 49(3): 0322001
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