• Infrared and Laser Engineering
  • Vol. 49, Issue 6, 20200147 (2020)
Rujun Liu1, Cheng Ma1, Wei Shi1、*, Zhaoyu Hui2, and Yuhua Hang2
Author Affiliations
  • 1西安理工大学 应用物理系 陕西省超快光电技术与太赫兹科学重点实验室,陕西 西安 710048
  • 2苏州热工研究院有限公司,江苏 苏州 215004
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    DOI: 10.3788/IRLA20200147 Cite this Article
    Rujun Liu, Cheng Ma, Wei Shi, Zhaoyu Hui, Yuhua Hang. Study on time jitter and trigger synchronization characteristics of ns pulsed laser diode[J]. Infrared and Laser Engineering, 2020, 49(6): 20200147 Copy Citation Text show less
    Test system of single laser diode
    Fig. 1. Test system of single laser diode
    Nanosecond LD output waveforms
    Fig. 2. Nanosecond LD output waveforms
    Nanosecond LD outputs 200 overlapped waveforms
    Fig. 3. Nanosecond LD outputs 200 overlapped waveforms
    Parallel nanosecond LD time jitter test system
    Fig. 4. Parallel nanosecond LD time jitter test system
    Jitter time of LD1 under different driving voltages
    Fig. 5. Jitter time of LD1 under different driving voltages
    Jitter time of LD2 under different driving voltages
    Fig. 6. Jitter time of LD2 under different driving voltages
    Waveform of the 2 pulses LD with driving voltage of 300 V
    Fig. 7. Waveform of the 2 pulses LD with driving voltage of 300 V
    Synchronization of parallel nanosecond LD under different driving voltages
    Fig. 8. Synchronization of parallel nanosecond LD under different driving voltages
    Rujun Liu, Cheng Ma, Wei Shi, Zhaoyu Hui, Yuhua Hang. Study on time jitter and trigger synchronization characteristics of ns pulsed laser diode[J]. Infrared and Laser Engineering, 2020, 49(6): 20200147
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